ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,180, issued on Nov. 3, was assigned to SIEMENS Healthineers AG (Erlangen, Germany). "Method for assessing a component quality of an electron... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,181, issued on Nov. 3, was assigned to SK ON Co. LTD. (Seoul, South Korea). "Master jig and equipment diagnosis method using the same" was i... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,182, issued on Nov. 3, was assigned to United Semiconductor (Xiamen) Co. Ltd. (Xiamen, China). "Method for detecting defects of a semiconduc... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,183, issued on Nov. 3, was assigned to RICOH COMPANY LTD. (Tokyo). "Inspection apparatus, inspection method, and nontransitory recording med... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,184, issued on Nov. 3, was assigned to HITACHI ASTEMO LTD. (Ibaraki, Japan). "Defect inspection apparatus and defect inspection method" was ... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,185, issued on Nov. 3, was assigned to SK On Co. Ltd. (Seoul, South Korea) and SK Innovation Co. Ltd. (Seoul, South Korea). "Apparatus and m... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,186, issued on Nov. 3, was assigned to Lockheed Martin Corp. (Bethesda, Md.). "System and method to initiate foreign object debris (FOD) rem... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,187, issued on Nov. 3, was assigned to RADWISP PTE. LTD. (Singapore) and MEDIOTT Co. LTD. (Tokyo). "Diagnostic support program" was invented... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,188, issued on Nov. 3, was assigned to LungLife AI Inc. (Thousand Oaks, Calif.). "Systems and methods for designing accurate fluorescence in... Read More
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,189, issued on Nov. 3, was assigned to IMED TECHNOLOGIES INC. (Tokyo). "Image processing device, image processing method, program, and image... Read More